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Proceedings of CAD'15, 2015, 275-279
Multi-Sensor Blue LED and Touch Probe Inspection System

Kai Xue, Venu Kurella, Allan Spence, McMaster University

Abstract. In coordinate metrology, contact and non-contact measurement methods each have their own respective strengths and weaknesses. Touch-trigger probes can achieve low uncertainty, and perform well inside deep holes, but have low data acquisition speed. In contrast, non-contact digitizers collect high density surface point clouds in seconds, and are much less likely to suffer from sensor collisions with the part, but have higher uncertainty. Development of a multi-sensor inspection system that synergistically conjoins their individual task specific advantages is described herein. A long standing problem in tactile measurement is the situation when features of sheet metal parts produced at early production stage significantly deviate from CAD nominal. Consequently, Dimensional Measuring Interface Standard (DMIS) inspection paths created using the CAD nominal geometry can no longer be used without introducing significant part surface cosine error. In more extreme cases, missed touches or probe collisions can occur. Existing methods for solving this problem have included taking preliminary sample points around the (hole or other) feature, and then iterating to obtain more accurate results. To solve this more efficiently, a multi-sensor blue LED structured light scanner and touch-trigger inspection system was developed and is reported in this paper. Calibration of the scanner with respect to the CMM was investigated using a designed angled slot target. 

Keywords. Coordinate metrology, Multi-sensor inspection, Structured light

DOI: 10.14733/cadconfP.2015.275-279